phoenix nanome|x NEO High-Resolution Nanofocus X-Ray Inspection System
The phoenix nanome|x is an ultra high-resolution nanofocus X-ray inspection system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. The sys
Superior dual detector technology (digital image chain and active temperature-stabilized digital detector with 30 fps) for brilliant live images
Automation of inspection steps possible
Outstanding ease-of-use
Key Features:
High magnification
Precise Manipulation
High repeatability
180 kV / 15 W high-power open nanofocus tube with up to 200 nanometer detail detectability
Upgradeable to nanoCT® and / or planarCT
Optional:
phoenix x|act software package for easy and fast CAD based high-resolution automated X-ray inspection (μAXI) for extremely high defect coverage with high magnification and repeatability
Brilliant live inspection images due to high dynamic temperature-stabilized digital GE DXR detector with 30 fps (frames per second) and active cooling
3D computed tomography scans within 10 seconds
Up to 2 times faster data acquisition at the same high image quality level by diamond|window