phoenix v|tome|x m - versatile industrial CT Scanner for fully automated industrial Computed Tomography

CUSTOMER BENEFITS

• First industrial microCT system with advanced scatter|correct technology for highly improved CT quality level compared to conventional microfocus cone beam CT
• high-flux|target: Maintain high image quality and scan much faster, or with improved accuracy
• High precision 3D metrology and non-destructive testing tasks performed with minimal operator training
• Increased 3D inspection throughput due to efficient high-flux|target, fast detector technology and a high grade of automation
• dynamic 41|100 detector: Doubled CT resolution at same scanning time or doubled throughput at same quality level compared to state of the art 200 μm pitch DXR detectors
• Optional production|edition with collaborative robot for fully automated high throughput CT inspection
• All major hardware and CT software components of the system are proprietary GE technology optimally compatible with one another
• NEW: The phoenix v|tome|x m is now also available in specific countries as special metrology edition with a measurement accuracy of 4+L/100 µm referring to VDI 2630 guideline (measured as deviation of sphere distance in tomographic static mode SD (TS), method details referring to VDI 2630-1.3 guideline on request, valid only for phoenix v|tome|x m metrology edition).
   

KEY FEATURES

• First compact 300 kV microfocus CT system with < 1 µm detail detectability
• Industry-leading magnification and power at 300 kV for high absorbing samples
• First industrial CT scanner coming standard with GEs 16" 200 µm pixelsize dynamic 41|200 detector for 2-3x increased scan throughput, optional with GEs dynamic 41|100 detector for doubled resolution at same scanning time compared with state of the art 200 µm DXR detectors.
• Unique dual|tube configuration for high power µCT as well as high resolution nanoCT^®
• The v|tome|x m is the only microCT system worldwide available with the breakthrough scatter|correct technology innovation. This technological advancement automatically removes scatter artifacts from the CT volume, allowing users to gain significant improved CT results compared to conventional cone beam microCT. 
• The new GE high-flux|target makes CT scanning more efficient due to up to 2 times faster microCT scans or doubled resolution.
• Optimized ease of use due to advanced phoenix datos|x CT software with automated click & measure|CT option
• Optimized CT acquisition conditions and 3D metrology package with temperature stabilized X-ray tube, digital detector array and cabinet as well as high accuracy direct measuring system

KEY APPLICATIONS

• Internal defect analysis / 3D quantitative porosity analysis
• Assembly control
• Materials structure analysis 
• 3D Metrology accuracy specification of 4+L/100 μm referring to VDI 2630 guideline
• Nominal-actual CAD comparison
• Dimensional measurements / wall thickness analysis
• Reverse engineering / tool compensation

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